Polytec: Area-Wide Layer Analysis Using Hyperspectral Imaging

PVA Vision’s VEpioneer hyperspectral vision system not only provides information on individual measurement points but also delivers spectral data across the entire sample with high spatial resolution. This allows for the detection of not only coating thickness but also homogeneity, local variations, defects, and contamination. Depending on the material and application, coating thicknesses ranging from 1 nm to 500 µm can be analyzed. The fully integrated benchtop system is suitable for various substrates and materials, such as metals, glass, polymers, and semiconductor materials. Various sensor configurations and wavelength ranges allow for adaptation to different measurement tasks.

Portfolio Expanded to Include Optical Methods for Coating Characterization

With the VEpioneer, Polytec is expanding its portfolio of optical methods for coating characterization, particularly for applications where not only individual measurement points but also the spatial distribution of a coating needs to be examined. These include, for example, thin functional and organic coatings, polymers, and sophisticated coating systems. “With this system, we are expanding our portfolio to include a technology with which we have been familiar for many years,” says Dr. Dirk Samiec, Business Unit Manager for Photonics at Polytec. “Our experience with hyperspectral imaging and challenging measurement tasks enables us to provide sound application consulting. At the same time, the system stands out thanks to its combination of area-wide analysis, a wide range of layer thicknesses, and non-contact measurement.”