Helmut Fischer: Next generation of XRF measuring devices and AI software
With the two devices Fischerscope XDAL and Fischerscope XDV, the Helmut Fischer Group presents a new generation of its high-end segment for coating thickness measurement and material analysis using X-ray fluorescence (XRF).
If you value high-precision and particularly reliable non-contact XRF measurements, then Fischer is the right address for you. Compared to the previous models, the new XDAL and XDV devices achieve 6 times faster positioning of the Z-axis, up to 14 times faster autofocus with a focusing time of less than 2 seconds and 10 times higher camera resolution, according to the manufacturer. Equipped with a powerful overview camera and state-of-the-art multi-zone LED lighting, the devices provide the optimum illumination for the most accurate analyses for all types of surfaces - whether matt, glossy or reflective. The new products make measurements even more efficient while at the same time providing market-leading measurement accuracy. The optimized distance between the X-ray tube, sample and detector ensures maximum intensity yield and always guarantees high-quality and repeatable results.
XRF measurement solutions for coating thickness measurement and material analysis
"With the introduction of our new Fischerscope XDAL and Fischerscope XDV measuring instruments and the new Fischer Fisiq X software, we are setting another milestone in the development of innovative, customer-oriented XRF measurement solutions. The new generation scores with unique features, uncompromising quality and combines outstanding measurement performance with efficient workflows for reliable quality assurance in numerous industries," explains Dr. Martin Leibfritz, CEO of the Helmut Fischer Group. Other practical features such as the device's status light, the automated measuring hood and a solid selection of standardized calibration workflows complete the overall package.
AI-supported XRF software for faster measurement
As high performers, the devices cover a wide range of different applications. While the Fischerscope XDAL is geared towards the electroplating and coating industry and the electronics sector, among others, the Fischerscope XDV serves applications in the semiconductor, energy, automotive, banking and customs, hallmarking, jewelry and watchmaking industries. The new generation of devices is accompanied by a completely new software solution. With Fisiq X, Fischer is launching the first and only XRF software with AI-supported spectrum mode. Thanks to the improved algorithms, it calculates the measurement results up to 6 times faster for coating thickness measurement and up to 13 times faster for material analysis. The modern and intuitive user interface offers a completely new user experience and ensures that even inexperienced beginners always receive the best possible support so that measurements are easy to perform.
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