Helmut Fischer at ZVO Surface Technology Days 2026: XRF Instruments

At the 2026 ZVO Surface Technology Conference in Karlsruhe, the Helmut Fischer Group will be showcasing its new product, the Fischerscope Xdal, at Booth 44. This high-end analytical instrument for coating thickness measurement and material analysis uses X-ray fluorescence (XRF) and impresses not only with its modern redesign but, in particular, with faster and smarter measurement processes. In combination with the AI-powered XRF software Fisiq X, Fischer is setting new standards for even more efficient quality control with this new generation of instruments.

High-end analyzer for coating thickness measurement and material analysis

Introducing the Fischerscope Xdal, which was developed specifically for high-precision measurements of thin and very thin coatings. Thanks to optimized measurement geometry, significantly faster sample positioning, and the new user-friendly Fisiq X software, the Xdal offers maximum efficiency and measurement reliability. The Xdal opens up new possibilities for reliable quality control, particularly for applications in the electroplating and coating industries as well as the electronics sector. In addition to the presentation of the new Fischerscope Xdal, visitors to the ZVO Surface Days 2026 can also look forward to a program of technical presentations. In her presentation titled “XRF – Choosing the Right Anode Material,” Fischer expert Johanna Malina Zeiss will explain how the choice of anode material influences the performance of X-ray fluorescence measurements and which factors should be considered when making that selection.