New X-Rite Color Measurement Device for small, complex parts
X-Rite Incorporated has announced the release of the CiF3200 Imaging Spectrophotometer, a color measurement device designed for color measurement of small, irregularly shaped, multicolored and highly reflective objects.
With a minimal measurement area of just 2mm, X-Rite's CiF3200 spectrophotometer enables manufacturers to set and communicate digital color standards for small components, improving quality control and reducing rework. Ideal for applications where detail, consistency and accuracy are critical, such as luxury goods, consumer electronics and plastic components, the CiF3200 combines advanced features such as virtual apertures from 2-12 mm, on-screen targeting for precise sample alignment and automatic multi-color extraction to deliver fast, repeatable color measurements and support objective, data-driven evaluation.
The CiF3200 Sphere benchtop spectrophotometer offers simultaneous SPIN/SPEX capability. It enables the measurement of brilliance, which is critical for quality control of metals and materials that may exhibit optical variations due to surface processing and metal reflection. Whether it's maintaining color harmony on luxury watches or verifying part-to-part consistency on small molded parts, the CiF3200 helps manufacturers improve quality assurance with confidence and efficiency. "With the CiF3200, we are addressing a unique need in the industry - consistent color measurement on small or unusually shaped parts," said Dave Visnovsky, product manager at X-Rite. "By combining advanced targeting and imaging technology with sphere measurement technology and an aperture as small as 2mm, the CiF3200 allows customers to digitize their standards and streamline quality control in a way that simply wasn't possible before."