Polytec: Area-Wide Layer Analysis Using Hyperspectral Imaging
Polytec is expanding its portfolio for optical coating characterization with the VEpioneer hyperspectral vision system from PVA Vision. The compact…
DataPhysics dpiMAX Software Now Available for Additional Measurement Devices
DataPhysics Instruments is expanding the scope of application for its dpiMAX device software. In addition to the OCA series contact angle meters, the…
Micro-Epsilon: Confocal 3D Sensor Measures Complex Surfaces
The new ConfocalLine CLI8500 confocal-chromatic line sensor from Micro-Epsilon detects fine structures on matte, highly reflective, and transparent…
X-Rite Pantone Integrates Color Measurement for Surfaces
With Spectura, X-Rite Pantone is introducing a new generation of portable spectrophotometers for color control of surfaces. The platform is designed…
Fraunhofer Vision: Hands-On Seminar on Surface Inspection with a Practical Component
On December 2 and 3, 2026, the Fraunhofer Vision Division will host the seminar and hands-on workshop “Inspection and Characterization of Surfaces…
Adphos ThermoLab (aTL): Testing, Rental, and Use in Own Lab
The Adphos ThermoLab (aTL) combines synchronous measurements of mass and temperature to provide visibility into drying, heating, and other thermal…
Helmut Fischer auf der Electronica 2026: Messlösungen für die Elektronikindustrie
Auf der Messe Electronica 2026 in München präsentiert die Helmut Fischer Gruppe innovative Messlösungen für die Elektronikindustrie -…
Igos Institute at the ZVO Surface Technology Conference 2026: Testing Services
The Igos Institute for Electroplating and Surface Technology will be exhibiting at Booth 21 at the ZVO Surface Technology Days 2026. As a testing…
LUM to Showcase Measurement Technology at the Sepawa Congress 2026
At the Sepawa Congress 2026 in Berlin, LUM will present solutions for particle characterization, stability assessment, and the determination of…
Bruker Alicona at AMB: Optical Coordinate Measuring System
Bruker Alicona will present the μCMM NEO optical coordinate measuring system for the first time in Europe at AMB 2026. It combines the measurement of…
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