Fraunhofer IST: Precise measurement for better diamond coatings
The Fraunhofer IST has developed a new measurement and evaluation method with which the optical constants of large-area diamond coatings can be…
LUM sponsors World Congress on Particle Technology (WCPT 10)
From May 11-15, 2026, the 10th World Congress on Particle Technology (WCPT) took place in Osaka, Japan. The measurement technology specialist LUM GmbH…
Sensor + Test 2026: Platform for sensor and measurement technology
The Sensor + Test trade fair, the central platform for the sensor and measurement technology industry, will once again open its doors in Nuremberg…
Precitec Optronik: Non-contact coating thickness testing with laser
Precitec Optronik is presenting a non-contact laser coating thickness measurement system at SurfaceTechnology Germany 2026. The photothermal…
Helmut Fischer at The Battery Show Europe 2026
At The Battery Show Europe 2026, the Helmut Fischer Group will be presenting high-performance solutions for coating thickness measurement and material…
Polytec appoints Dr. Alexander Huber as Chief Executive Officer
Polytec GmbH has appointed Dr. Alexander Huber as Chief Executive Officer (CEO) with effect from April 2026, setting the course for the company's next…
Inline measurement technology and closed-loop processes: Bruker Alicona on GrindingHub
At GrindingHub 2026, Bruker Alicona will be demonstrating how optical 3D measurement technology can be integrated directly into manufacturing…
Helmut Fischer at the SurfaceTechnology 2026: World of measurement technology
At the SurfaceTechnology Germany 2026 trade fair in Stuttgart, the Helmut Fischer Group will be presenting a wide range of measuring solutions as a…
Wenglor color sensor P1PF for color evaluation and color control
With the P1PF color sensor, Wenglor presents a solution for reliable color detection in demanding industrial applications. The sensor combines two…
Fraunhofer IPMS analyzes contamination of wafer surfaces
The Fraunhofer Institute for Photonic Microsystems IPMS is expanding its analytical capabilities in the field of wafer contamination. Vapor phase…
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