Transmission electron microscope

The transmission electron microscope (TEM) is a powerful instrument in surface technology that is used to examine the internal structure of materials at the atomic level. In contrast to conventional light microscopes, the TEM uses a beam of electrons instead of light to produce high-resolution images of the sample.

In surface engineering, the TEM enables the detailed study of the microstructure of materials, including their crystal structure, defects, interfaces and inclusions. By analyzing these features, researchers can gain important insights into material properties that are relevant to the performance and functionality of surfaces.

The TEM is particularly useful for the characterization of thin films, nanomaterials, coatings and interfaces as it can achieve resolutions in the range of a few nanometers. This enables the visualization of individual atoms and the investigation of structure-property relationships at the nanoscale level.

In materials science, TEM is widely used to study the structure and composition of materials for various applications, including semiconductors, nanoparticles, catalysts, polymers and biomaterials. Chemical and crystallographic information can also be obtained by combining it with special techniques such as electron diffraction, energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS).

Analysis with TEM in surface technology enables researchers to optimize materials in a targeted manner in order to improve their mechanical, electrical, optical and chemical properties. This contributes to the development of new materials and technologies and supports innovation in various industrial sectors. Overall, the transmission electron microscope is an indispensable instrument for the high-resolution characterization of materials in surface technology and materials science.