Scanning probe microscope (SPM)

The scanning probe microscope (SPM) is a high-resolution imaging technique in surface technology that enables surface structures to be imaged at an atomic or molecular level. In contrast to conventional optical microscopes, the scanning probe microscope does not use optical lenses but a fine probe tip to scan a sample at the atomic level.

The scanning probe microscope works by measuring the interaction forces between the probe tip and the sample. These forces are measured during the scan and allow the generation of detailed topographical maps of the surface. Due to the extremely fine probe tip and the ability to scan surfaces with atomic precision, the scanning probe microscope achieves an exceptionally high spatial resolution.

There are different types of scanning probe microscopes, including the atomic force microscope (AFM), the scanning tunneling microscope (STM) and the scanning capacitance microscope (CFM). Each of these microscopes has its own specific applications and capabilities.

The scanning probe microscope is widely used in surface technology and materials science. It enables not only the high-resolution visualization of surface structures, but also the characterization of mechanical, electrical and magnetic properties on a microscopic level. Due to its versatility and high resolution, the scanning probe microscope plays a key role in the investigation and development of materials in various scientific and industrial fields.