Scanning electron microscopy (SEM)

Scanning electron microscopy (SEM) is a powerful technique in surface technology that makes it possible to obtain high-resolution images of surface structures. In contrast to conventional light microscopy, SEM uses electron beams instead of visible light, which leads to a significantly higher resolution.

In surface technology, scanning electron microscopy is widely used for the detailed characterization of material surfaces. By using electron beams, the finest details and structures can be imaged in a range from a few nanometers to micrometers.

A characteristic feature of scanning electron microscopy is the ability to generate three-dimensional images of surfaces. This enables precise analysis of topographies, particle distributions and surface structures on a microscopic level.

SEM is often used in combination with other techniques such as energy dispersive X-ray spectroscopy (EDX) to obtain additional information about the chemical composition of the surface. This integrated analysis enables a comprehensive characterization of material surfaces.

Scanning electron microscopy plays a crucial role in various areas of surface technology, from the quality control of coatings and materials to the investigation of surface morphologies in nanotechnology. Through the detailed visualization of micro- and nanostructures, SEM helps to gain a better understanding of material properties and drive the development of innovative surface solutions.