Image analysis methods

Image analysis methods are a widely used measurement technique in surface technology for characterizing and quantifying surface structures. This technique makes it possible to capture optical images of surfaces and extract important information about their topography, texture and features without using enumerative lists.

The image analysis methods include a variety of techniques, including automatic image segmentation, edge detection, shape detection and texture analysis. These techniques are used to characterize the structure of surfaces and quantify parameters such as roughness, shape, size, distribution and arrangement of features.

A frequently used image analysis method in surface technology is atomic force microscopy (AFM), which provides high-resolution topographical images of surfaces on a microscopic and nanoscale level. By analyzing these images, parameters such as roughness, surface structure and particle size can be determined. Another image analysis method is optical profilometry, in which surface structures are characterized using optical images and interference patterns. This technique enables the non-invasive measurement of surface profiles with high lateral resolution.

The image analysis methods are used in various areas of surface technology, including materials science, nanotechnology, microelectronics, coating technology and biotechnology. They play an important role in quality control, process monitoring, product development and scientific research. Overall, image analysis techniques are a powerful and versatile measurement technique in surface technology, which makes it possible to obtain detailed information about the structure and properties of surfaces and thus contribute to the development of advanced materials and technologies.