Cut-off wavelength

The cut-off wavelength, also known as the profile filter, is a term used in physics, particularly in surface characterization. It is closely associated with the terms roughness and waviness. Roughness describes microscopic irregularities and unevenness on a surface, while waviness refers to larger, periodic structures.

The cut-off wavelength makes it possible to distinguish between different scales of surface structures. It defines the wavelength at which the roughness changes to waviness. This transition is important because it provides information about the characteristics of the surface and makes it possible to understand the different structures and their effects on physical phenomena.

In various fields of application, such as materials science, optics or surface technology, the cut-off wavelength plays a decisive role in the analysis and optimization of surface properties. It serves as a parameter to characterize and control the interaction of light, sound or other waves with the surface.