Atomic force microscope (AFM)

The atomic force microscope (AFM) is a high-resolution imaging technique in surface technology that makes it possible to image the structure and topography of surfaces at the atomic level. In contrast to conventional optical microscopes, the AFM does not work with light, but uses a fine tip that is moved over the surface to be examined.

The AFM works by measuring the forces between the tip and the sample surface. As the tip moves over the surface, atomic forces act between the tip and the atoms on the surface. These forces are measured and enable the creation of high-resolution, three-dimensional images of the surface structure.

The atomic force microscope offers numerous advantages in surface technology. It not only enables the visualization of structures in the nanometer range, but also the characterization of mechanical properties such as hardness, elasticity and adhesion on a microscopic level. Another advantage of the AFM is its versatility. It can be used in both air and liquids, which enables the investigation of a wide range of samples, from solids to biomolecules and thin films.

The fields of application of the atomic force microscope extend across various disciplines, from materials science to biology and nanotechnology. Through the precise characterization of surface structures at the atomic level, the AFM plays a key role in the development and optimization of materials in modern surface technology.