LUM sponsors World Congress on Particle Technology (WCPT 10)

From May 11-15, 2026, the 10th World Congress on Particle Technology (WCPT) took place in Osaka, Japan. The measurement technology specialist LUM GmbH actively supported this event as a sponsor.
LUM GmbH specializes in particle characterization, stability evaluation of suspensions and emulsions and determination of adhesive strength and was a sponsor at WCPT 2026. In a special session organized by Prof. Dr. Dr. Lerche, founder and Managing Director of LUM GmbH, the community celebrated 100 years of analytical (ultra) centrifugation. The event kicked off with his presentation "From the development of the Svedberg Analytical Ultracentrifuge to current numerous applications of AC and AUC sedimentation analysis". The exciting topics covered in this session included: "Characterization of nanoparticles - Global analysis of sedimentation data from multiwavelength analytical ultracentrifugation and analytical centrifugation" (Spruck et al.), "Surface Modification of Silica Particles and Its Influence on Particle-Liquid Interactions" (Takai-Yamashita), "A Method for Determining the Hamaker Constant of Particulate Materials Using Sedimentation Technique" (Takeda et al.), "Analytical-centrifugation-informed dispersion formulation and thin film fabrication of gas-phase synthesized graphene" (Segets), which demonstrate the performance and versatility of the LUMiSizer analytical centrifuge for current and future challenges.
LUM with presentations at the WCPT
With the other scientific contributions "Single Particle Light Scattering Analysis: A Simple, High-Resolution Approach to Nano- and Microparticle Counting and Sizing" and "Reliably Counting the Unseen: Establishing a First-of-its-Kind Nanoscale Number Concentration Standard" (Hood et al.), LUM shared its own findings in the field of single particle characterization with the researching specialist audience. Lerche's contribution "In-Line Characterizing Concentrated Liquid dispersions by means of Spectral Reflectance Measurement" was aimed more at industrial users. The importance of LUM technologies for scientific and industrial problem solving in the fields of particle size analysis and industrial separation technology was underlined by the presentations of the renowned speakers Babick and Gleiss on the topics of "Comparability of sedimentation-based particle size analysis: Impact of measurement technique and operational parameters" and "Enhancing Solid Bowl Centrifuge Scale-up Through Analytical Centrifugation and Numerical Modeling".
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