Helmut Fischer at Control 2025: Measuring devices for surface inspection

At Control 2025, Helmut Fischer will be presenting the high-performance XRF measuring device Fischerscope X-RAY XDV-µ LD from the high-end X-ray fluorescence series. It was specially designed for high-precision coating thickness measurement and material analysis on the finest structures with challenging geometries. In addition to numerous application possibilities in various industries, it is ideally suited for precise measurement on the smallest components and structures, such as printed circuit boards or plug contacts. The DMP series offers powerful tactile measuring devices for maximum flexibility in coating thickness measurement. The compact handheld devices impress with their versatile functions, robust and modern design, digital probes and intuitive software.

With the Fischerscope MMS Automation, Fischer is presenting its high-performance automation solutions. The Fischerscope XAN Liquid Analyzer, which enables fully automatic and continuous analysis of the metal concentration in up to four electroplating baths, will also be on site. At the Fischer stand, interested visitors will have the opportunity to test all devices, probes and software in detail. Experts from the application, sales and service departments will be available for consultation and will provide comprehensive information about the various measurement solutions, areas of application, innovative technologies and the company's comprehensive service. The Helmut Fischer GmbH stand at the Control trade fair is located in Hall 7, Stand 7501.